Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT)

Availability: Not accessible (in many cases you can see the TOCs and abstracts)
Homepage(s): http://imapsource.org/loi/apap
Fulltext available since: Volume 2010 (2010)
Publisher: IMAPS
Subject(s): Electrical Engineering, Measurement and Control Technology
P-ISSN(s): 2380-4491
Appearance: Fulltext, online and print
Costs: subject to fee